June 23–25, 2026
Messe Stuttgart, Germany

Innovation Showcase

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CT-based reverse engineering for automotive benchmarking and CAE

25 Jun 2026
Thursday, June 25, Testing Stage 2 - morning session
This presentation introduces how industrial x-ray CT can accelerate automotive engineering through high-precision reverse engineering of complex assembled components. CT scanning captures internal geometries non-destructively, including multimaterial parts and hidden structures that conventional measurement cannot access. The segmented 3D models can be directly used for CAE simulation, benchmarking, failure analysis and competitive product evaluation. A practical workflow – from CT scanning to simulation-ready models – will be presented, showing how this approach enables faster design validation, deeper insight into competitor products and more efficient engineering decisions in automotive development.
  • How CT scanning enables the creation of high-fidelity 3D models for complex assemblies, ensuring more accurate and reliable CAE simulation results
  • Techniques for non-destructively analyzing the internal architecture of competitor products to support benchmarking and product evaluation
  • How reverse engineering services help engineers obtain accurate 3D models of complex assemblies when CAD data is unavailable
Speakers
Mitsuhiro Takayama, technical advisor - RPV

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